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2013 Ieee European Test Symposium (Ets)


Topics/Call fo Papers


IEEE Conference Record #: 21204

Conference Title: 2013 Ieee European Test Symposium (Ets)

Conference Acronym: ETS

Conference Dates: 5/27/2013 to 5/30/2013

Location: Conference Center of Popes' Palace

City: Avignon

Country: France

State/Province:

Exhibits: N No. of Exhibits: 0 Tutorials: N Attendance: 200 Producing Publication: Y Concentration Banking Info: No

Conference Scope: ETS is Europe s premier forum dedicated to presenting and discussing scientific results, emerging ideas, practical applications, hot topics and new trends in the area of electronic-based circuits and system testing.

Conference Keywords: test, dft, atpg, bist, fault tolerance,ets

Conference Focus: Application,Scientific/Academic

WWW URL: www.lirmm.fr/ETS13

CFP URL: http://www.lirmm.fr/ETS13/documents/ETS13_Preliminary_cfp_final.pdf

Abstract Submission Date: 12/3/2012

Notification of Acceptance: 2/20/2013

Final Paper Submission Date: 4/1/2013