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2013 IEEE Semiconductor Wafer Test Workshop (SWTW 2013)

Topics/Call fo Papers

IEEE Conference Record #: 20891

Conference Title: 2013 IEEE Semiconductor Wafer Test Workshop (SWTW 2013)

Conference Acronym: SWTW

Conference Dates: 6/8/2013 to 6/12/2013

Location: Rancho Bernardo Inn

City: San Diego

Country: USA

State/Province: CA

Exhibits: Y No. of Exhibits: 35-40 Tutorials: Y Attendance: 350 Producing Publication: Y Concentration Banking Info: Y

Conference Scope: The IEEE SW Test Workshop is the only workshop specializing in semiconductor wafer level testing. It has a comprehensive technical program that is complemented by social activities which promote networking and sharing among the attendees. Booth displays at SWTW provide attendees with a on-stop opportunity to meet firsthand with all the key suppliers and learn about their new products and services.

Conference Keywords: southwest, test, swtw, semiconductor, wafer, test, wafer test, probe card, prober, ate, pcb

Conference Focus: Application



Abstract Submission Date: 2/22/2013

Notification of Acceptance: 3/15/2013

Final Paper Submission Date: 4/19/2013